RFRF and SoC Device Production Tests: A Comprehensive Guide
rf testing
soc testing
manufacturing test
test procedure
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This page lists common production or manufacturing tests performed on RF and SoC (System-on-a-Chip) devices. These tests include VSWR, return loss, gain, IQ mismatch, IP3, TOI, and more.
Test Parameter Matrix
The following table shows which tests are typically performed on different RF and SoC components.
| Parameter | LNA | PA | Mixer | Switch | Transmitter | Receiver |
|---|---|---|---|---|---|---|
| VSWR | X | X | X | |||
| Return Loss | X | X | X | X | X | |
| Insertion Loss | X | |||||
| Gain | X | X | X | |||
| Gain Flatness | X | X | ||||
| Isolation | X | X | ||||
| Linearity | ||||||
| Noise Figure | X | X | X | X | X | |
| Dynamic Range | X | X | ||||
| Power Consumption (e.g., P1dB) | X | X | X | X | ||
| Third Order Intermodulation Product (IP3) | X | X | X | X | X | |
| Third Order Intercept Point (TOI) | ||||||
| Harmonic Distortion | X | X | ||||
| Conversion Loss/Gain | X | |||||
| Intermodulation Distortion | ||||||
| Switching Speed | X | |||||
| Bandwidth | X | X | X | X | ||
| Power Added Efficiency (PAE) | X | |||||
| Spurious Output | X | X | ||||
| RF-LO Rejection | X | X | X | |||
| ACPR/ACLR | X | X | ||||
| Phase Noise | X | X | ||||
| IQ Offset | X | X | ||||
| IQ Amplitude Match | X | X | ||||
| IQ Phase Match | X | X | ||||
| Output Power | X | |||||
| Carrier Suppression | X | |||||
| Error Vector Magnitude (EVM) | X | X |
